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Low air pressure, Accelerated life test

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IC Burn-In Test Chamber

Type：TYCT
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Product description, Technical parameters and configuration

Features
SATAI/II/III testing
Customize the quantity of SATA,PCIE that are being tested, such as 96, 156, 216, 316 pieces, etc.
Temperature range: -70° C~ + 1 80° C
Abnormal outage test and aging test
Automatic temperature controlling test
Fully adopt software to intellectualized control test
Customize testing software
Rapid heating&cooling control
Support PCIE/EMMC/UFS/DRAM/Flash customized aging test
Control based on network, capable of controlling testings remotely and view the test results.
Capable of inventing software to control testing remotely

Technical Specifications

Model	TYCT-300
Temperature manipulation range	RT + 5°C~ + 150°C Optional
Temperature uniformity ° C	±2°C
Test quantity	300 Optional
Power supply	220VAC ±10%, 50HZ