Highly Accelerated Stress Test Chamber

Highly Accelerated Stress Test Chamber is used in integrated circuit/microelectronics /IC and other business fields, the purpose of its test is to improve the environmental stress, such as temperature and working stress applied to the voltage/load of products, speed up the testing process, short¬en the product or system life testing time. It is used to inves¬tigate and analyze when abrasion and service life problems occur in the tested samples, as well as service life faults. And the tests are conducted to analyze the shape of the distribu¬tion functions and the reasons for the increase in failure rate.

Features
Smart saturated steam temperature, the manual control device with full and steam pressure detector
Platinum temperature sensor (PT-100) senses pre¬cise temperature
If s convenient for tested samples and steam shock isolation devices to be taken place
Patented automatic pressure safety latch control device
Automatic vacuum cleaning program to reduce con-tamination
Other expandable function: record temperature and humidity/pressure

Technical Specifications